Advanced Systems Design VI
Vladimir  Ovod, Ph.D.                                                                                            Publications


Over 15 years in Advanced Systems Design (ASD)



    Research, development, and implementation of medical, commercial and military systems and
    sensors:
    - Modeling, simulations, design and optimization of electro-optical sensors, systems, imagers, and   
    control algorithms and automated tests and characterizations
    - Design of firmware- and software using Matlab, C, Simulink, Polyspace, Xilinx Sysgen, ISE
    - Theoretical background and hands-on experience in measurement techniques, characterizations,
    test automation, DSP, data-acquisition, control- and image processing
          
  • Systems design tools and methodologies: MKS/PTC tool for soft- and hard-ware bug tracking and Agile SCRUM
    methodologies for leading engineering teams in SW, FW and HW design.



  • Aerosols, suspensions, colloids, powders, biological cells, oils and other kind of particles used, in particular: in
  • Semiconductor industry, clean room industries, medicine, pharmaceutics, biotechnology, oil, gas, paint, food
    and other areas.
  • Increasing accuracy of optical particle sizing systems based on the following techniques:
  • Single Particle Interaction with a Laser Beam (SPS )
  • Dynamic Light Scattering / Photon Correlation Spectroscopy (DLS )
  • Phase Doppler Anemometry (PDA)
  • Fraunhofer Diffraction (light scattering by ensemble of particles)
  • Electrophoretic Light Scattering (ELS);
  • Combining the advantages of different types of particle size analyzers;
  • Converting measurement results obtained by various particle size analyzers to the general platform;
  • Improving instrument's performances through:
  • Providing numerical modeling, of measurement results by using multiple light scattering algorithms.


  • CDMA (code division multiple access) RF power amplifiers, control DSP algorithms and code for:
  • adaptive power managements
  • self characterization
  • failure detection
  • failure  recovery of cellular amplifiers.